2013年9月22日星期日

The new sub-nanometer resolution coaxial laser profile measurement system

Theoretically elaborated coaxial laser profile measurement technology principle, analysis of the impact test system vertical resolution and horizontal resolution of the main factors. And on the basis of the theoretical research, developed a new type of  abrasive wheels  resolution coaxial laser profile measurement system, which is mainly used to measure ultra-fine  synthetic diamond powder . The project developed by the sub-nanometer  Abrasive grinding wheel  profile measurement system is based on H_e-N_e double longitudinal mode laser laser as a light source, its operating frequency (beat frequencies) is 790MH_z. It applies not only static, but also dynamic measurement also has excellent characteristics.

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