Wheel must be used with safety guards. The actual rotational axis of the wheel and its axis of rotation through the center of mass deviation from parallel state called static unbalance wheel. This is usually due wheel uneven density, both ends of the hole and the surface is not parallel or coaxial cylindrical deviation has caused.
2013年9月16日星期一
Change the wafer planarization processing technical problems faced by many outstanding
IC chip in order to increase production, reduce unit manufacturing costs tend large wafer diameter. As wafer diameter increases, in order to ensure sufficient strength of silicon, a corresponding increase in the thickness of the wafer; the contrary, in order to
cubic boron nitride of advanced IC chip packaging technology, thinner thickness of the chip. These changes make the wafer planarization process faces many outstanding technical issues: IC feature size decreases, for wafer
cutting tools and surface quality high demands; wafer diameter increases, the process is easy to warpage, machined surface type easy to ensure accuracy; silicon thickness
abrasive grinding and chip thickness decreases, so that the back of wafer thinning process increases the amount of material removal, improve processing efficiency become a serious problem.
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